• DocumentCode
    1443969
  • Title

    Guarded evaluation: pushing power management to logic synthesis/design

  • Author

    Tiwari, Vivek ; Malik, Sharad ; Ashar, Pranav

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • Volume
    17
  • Issue
    10
  • fYear
    1998
  • fDate
    10/1/1998 12:00:00 AM
  • Firstpage
    1051
  • Lastpage
    1060
  • Abstract
    The need to reduce the power consumption of the next generation of digital systems is clearly recognized at all levels of system design. At the system level, power management is a very powerful technique and delivers large and unambiguous savings. The ideas behind power management can be extended to the logic level. This would involve determining which parts of a circuit are computing results that will be used and which are not. The parts that are not needed are then “shut off”. This paper describes an approach termed guarded evaluation, which is an implementation of this idea. A theoretical framework and the algorithms that form the basis of the approach are presented. The underlying idea is to automatically determine the parts of the circuit that can be disabled on a per-clock-cycle basis. This saves the power used in all the useless transitions in those parts of the circuit. Initial experiments indicate substantial power savings and the strong potential of this approach for a large number of benchmark circuits. While this paper presents the development of these ideas at the logic level of design, the same ideas have direct application at the register-transfer level of design also
  • Keywords
    clocks; combinational circuits; integrated circuit design; logic CAD; benchmark circuits; clock cycles; guarded evaluation; logic level; logic synthesis; per-clock-cycle basis; power consumption; power management; power savings; register-transfer level; Automatic testing; Benchmark testing; Built-in self-test; Circuit testing; Design methodology; Energy management; Logic design; Sequential analysis; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.728924
  • Filename
    728924