Title :
Built-in self-test structures around cellular automata and counters
Author :
Das, A.K. ; Pandey, M. ; Gupta, A. ; Chaudhuri, P.P.
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
fDate :
7/1/1990 12:00:00 AM
Abstract :
BIST structures for on-chip generation of random, exhaustive and deterministic test patterns have been discussed in the paper. Isomorphism between maximal length LFSR (linear feedback shift register) and exhaustive CA has been established and the pseudorandomness properties of CAs in terms of well-suited autocorrelation functions have been investigated. Owing to the regularity in interconnection structure, additive group CA (cellular automata) offers advantages over LFSR. A method of covering deterministic test set by a counter-based scheme and its optimisation based on AT2 complexity has been discussed.
Keywords :
automatic testing; finite automata; integrated circuit testing; logic testing; AT2 complexity; autocorrelation functions; built-in self test structures; cellular automata; counters; deterministic test patterns; exhaustive CA; isomorphism; maximal length LFSR; on-chip generation; pseudorandomness properties;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
