Title :
An Industrial Study of System-Level Test
Author :
Biswas, Sounil ; Cory, Bruce
Author_Institution :
Nvidia, Santa Clara, CA, USA
Abstract :
This paper discusses our experience with the advantages of having SLT in an industrial test flow. In addition, the level of correlation of SLT failures to parameters from other testing steps is also studied for an in-production IC in this work to evaluate if the system-level failures of an IC can be identified at other testing steps. Note that the correlation study performed in this paper is not intended to determine whether the SLT failures can indeed be effectively identified using parameters measured at other testing steps, but rather only to evaluate the difficulty of finding a high level of correlation.
Keywords :
failure analysis; integrated circuit testing; SLT failure; correlation level; in-production IC; industrial test flow; system-level failure; system-level test; Correlation; Frequency measurement; Graphics; Integrated circuits; Ring oscillators; Semiconductor device measurement; System-level design; Wafer scale integration; System-level test; final test; product SKU; test cost reduction; wafer sort;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2011.2178387
