Comparison of RSFQ Logic Cells With and Without Phase Shifting Elements by Means of BER Measurements

Author

Wetzstein, O. ; Ortlepp, Th ; Stolz, R. ; Kunert, J. ; Meyer, H.-G. ; Toepfer, H.

Author_Institution

Dept. of Quantum Detection, Inst. of Photonic Technol. (IPHT), Jena, Germany

Volume

21

Issue

3

fYear

2011

fDate

6/1/2011 12:00:00 AM

Firstpage

814

Lastpage

817

Abstract

Rapid single flux quantum (RSFQ) electronics is characterized by a very low switching energy. This advantage leads to a noise susceptibility, which becomes a challenge for large-scale circuits as well as for circuits using Josephson junctions with reduced critical current density. We demonstrate an improved operation range and advanced noise immunity of basic cells resulting from an implemented phase shifting element. One of those elements is the π-phase shifter. It consists of a single flux quantum trapped in a superconducting loop. The π-phase shifter can be easily produced in standard niobium technology without any process modifications. Utilizing a mature process brings advantages concerning the reliable fabrication of complex circuits.

Keywords

SQUIDs; error statistics; phase shifters; quantum optics; superconducting device noise; superconducting logic circuits; π-phase shifter; BER measurements; Josephson junctions; RSFQ logic cells; advanced noise immunity; critical current density; large-scale circuits; noise susceptibility; phase shifting elements; rapid single flux quantum electronics; superconducting loop; switching energy; Bit error rate; Clocks; Flip-flops; Josephson junctions; Noise; Switches; Thermal noise; RSFQ; bit error rate (BER); phase-shifting element (PSE); phaseshifter; thermal noise;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2010.2102998

Filename

5710010