• DocumentCode
    1444365
  • Title

    A Web Service and Interface for Remote Electronic Device Characterization

  • Author

    Dutta, Sumit ; Prakash, Shreya ; Estrada, David ; Pop, Eric

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • Volume
    54
  • Issue
    4
  • fYear
    2011
  • Firstpage
    646
  • Lastpage
    651
  • Abstract
    A lightweight Web Service and a Web site interface have been developed, which enable remote measurements of electronic devices as a “virtual laboratory” for undergraduate engineering classes. Using standard browsers without additional plugins (such as Internet Explorer, Firefox, or even Safari on an iPhone), remote users can control a Keithley source-measurement unit and monitor results in real time from anywhere on the Internet. As an in-class example, students in a solid-state electronics course used the Web site interface to make real-time transistor measurements. Recommendations are made on how to best integrate the interface into electronics classes based on the student assignment responses. The present interface is flexible and could be expanded to many other devices and instruments. The source code has been openly posted online.
  • Keywords
    Web services; Web sites; computer aided instruction; control engineering computing; educational courses; electronic engineering computing; electronic engineering education; telecontrol; virtual instrumentation; Internet; Keithley source-measurement unit; Web service; Web site interface; remote electronic device characterization; remote measurement; solid-state electronics course; standard browser; student assignment response; undergraduate engineering class; virtual laboratory; Browsers; Instruments; MOSFETs; Real time systems; Servers; Web sites; Educational technology; engineering education; metal-oxide-semiconductor field-effect transistors (MOSFETs); online services; virtual laboratory;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/TE.2011.2105488
  • Filename
    5710034