DocumentCode :
1444436
Title :
Data errors caused by surge voltages on paired-conductor lines
Author :
Chrysanthou, Chrysanthos ; Parente, Michael
Author_Institution :
Electromagn. Compatibility & Spectrum Manage. Group, Telcordia Technol., NJ, USA
Volume :
16
Issue :
1
fYear :
2001
fDate :
1/1/2001 12:00:00 AM
Firstpage :
131
Lastpage :
137
Abstract :
Impulse voltages may be coupled onto paired-conductor telecommunication lines by lightning or by disturbances on nearby power lines. These common-mode impulses are converted to differential-mode by unbalance of the conductors or by operation of surge protectors. Many of these differential-mode impulses can cause large numbers of bit errors and interfere with digital transmission. Statistical models have been previously developed to determine the common-mode to differential-mode conversion of impulse voltages on cable pairs. In this paper, these models are used to predict interference with digital transmission during lightning activity. This possible interference is expressed as expected number of errored seconds within one hour of lightning activity. Since operation of surge protectors causes data errors, this paper also examines how impulse limiting voltage of protectors affects data disturbances
Keywords :
arresters; digital communication; error analysis; lightning; surges; telecommunication cables; arresters; bit error rate; cable pairs; common-mode impulses; common-mode to differential-mode conversion; data errors; differential-mode impulses; digital communication; digital transmission; error analysis; impulse voltages; interference prediction; lightning; lightning activity; nearby power lines; paired-conductor lines; paired-conductor telecommunication lines; safety; statistical models; surge protectors operation; surge voltages; Bit error rate; Communication cables; Conductors; Error analysis; Interference; Lightning; Optical coupling; Predictive models; Surge protection; Voltage;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/61.905616
Filename :
905616
Link To Document :
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