DocumentCode
1444490
Title
Augmentation of SPICE for simulation of circuits containing resonant tunneling diodes
Author
Bhattacharya, Mayukh ; Mazumder, Pinaki
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume
20
Issue
1
fYear
2001
fDate
1/1/2001 12:00:00 AM
Firstpage
39
Lastpage
50
Abstract
This paper describes the incorporation of an accurate physics-based model of the resonant tunneling diode (RTD) into Berkeley SPICE version 3F5 and addresses the related direct current (dc) and transient convergence problems caused by the negative differential resistance (NDR) and the exponential nature of the device characteristics. To circumvent the de convergence problems, a new continuation technique using artificial parameter embedding and a current limiting algorithm are proposed. The studies made in this paper have shown that these techniques are superior to the in-built continuation methods of SPICE, such as Gmin-stepping and Source-stepping, for a large number of circuits of varying sizes. To improve transient convergence performance, the following three algorithms are added to SPICE: a modified forced-convergence algorithm, a new time-step adjustment algorithm, and a modified device voltage prediction algorithm
Keywords
Newton-Raphson method; SPICE; circuit simulation; integrated circuit modelling; negative resistance circuits; resonant tunnelling diodes; Berkeley SPICE version 3F5; SPICE; artificial parameter embedding; circuit simulation; continuation technique; current limiting algorithm; device voltage prediction algorithm; forced-convergence algorithm; negative differential resistance; physics-based model; resonant tunneling diode; resonant tunneling diodes; time-step adjustment algorithm; transient convergence; Circuit simulation; Computational modeling; Convergence; HEMTs; MODFETs; RLC circuits; Resonant tunneling devices; SPICE; Semiconductor diodes; Voltage;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.905673
Filename
905673
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