Title :
Fault location in cutpoint cellular arrays
Author :
Kodandapani, K.L. ; Swamy, M. E Sowmitri
Author_Institution :
University of Regina, Department of Computer Science, Regina, Canada
fDate :
6/1/1976 12:00:00 AM
Abstract :
A systematic procedure to locate a faulty cell in a column (row) of the main array (rotated array) in cutpoint cellular arrays is presented. It is assumed that a cell failure may be due to stuck-at faults at the input/output leads of the cell or due to stuck-at faults within the cell.
Keywords :
cellular arrays; fault location; logic testing; cell failure; cutpoint cellular arrays; fault location;
Journal_Title :
Electrical Engineers, Proceedings of the Institution of
DOI :
10.1049/piee.1976.0117
