• DocumentCode
    1444568
  • Title

    Experimental model of a silica/epoxy interface submitted to a hygrothermal aging: a dielectric characterization

  • Author

    Rain, P. ; Brun, E. ; Guillermin, C. ; Rowe, S.W.

  • Author_Institution
    Grenoble Electr. Eng. Lab. (G2Elab), St. Martin d´´Heres, France
  • Volume
    19
  • Issue
    1
  • fYear
    2012
  • fDate
    2/1/2012 12:00:00 AM
  • Firstpage
    343
  • Lastpage
    351
  • Abstract
    In order to investigate the influence of a hygrothermal aging on the organic/mineral interfaces of a silica filled epoxy resin, a macroscopic experimental model of a silica/epoxy interface was designed and realized. It consisted in coplanar interdigitated electrodes deposited on a quartz substrate moulded in epoxy resin. The dielectric properties have been followed at 80°C and 80% relative humidity. These properties have been compared with the evolutions of sheets and mouldings of unfilled epoxy resin submitted to the same conditioning. Measurements evidenced the formation of an interphase at the quartz/resin interface which appeared precisely when the water reached the quartz after its diffusion through the resin. The water bound to the resin during the conditioning of the unfilled samples induced a drop of resistance of nearly 3 decades. In the same time, due to the interphase which has grown at the organic/mineral interface, the resistance between the interdigitated electrodes fell of five decades, i.e. two more decades. This interphase is characterized by a surface resistivity of 80.106 Ω. This data may be used to evaluate prebreakdown phenomena resulting from a hygrothermal aging of silica/epoxy insulations.
  • Keywords
    ageing; composite insulating materials; dielectric properties; electric breakdown; epoxy insulation; humidity; silicon compounds; coplanar interdigitated electrodes; dielectric characterization; dielectric properties; hygrothermal aging; macroscopic experimental model; organic-mineral interfaces; prebreakdown phenomena; quartz substrate; quartz-resin interface; relative humidity; silica filled epoxy resin; silica-epoxy insulations; silica-epoxy interface; surface resistivity; Dielectrics; Electrodes; Epoxy resins; Silicon; Silicon compounds; Temperature measurement; Epoxy resin insulation; aging; composite insulation; dielectric measurements; humidity; interface phenomena;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2012.6148537
  • Filename
    6148537