DocumentCode
1444858
Title
Direct extraction of nonlinear FET I-V functions from time domain large signal measurements
Author
Currás-Francos, M.C. ; Tasker, P.J. ; Fernandez-Barciela, M. ; Keefe, S. S O ; Campos-Roca, Y. ; Sanchez, E.
Author_Institution
ETSI Telecomunicacion, Vigo Univ., Spain
Volume
34
Issue
21
fYear
1998
fDate
10/15/1998 12:00:00 AM
Firstpage
1993
Lastpage
1994
Abstract
A simplified method for extracting two port nonlinear field effect transistor current sources from time domain microwave voltage and current waveform measurements is presented. This method is based on the use of an appropriate reflective load-pull termination to ensure that the output voltage is 180° out of phase with the input voltage
Keywords
electric current measurement; microwave field effect transistors; microwave measurement; semiconductor device models; semiconductor device testing; voltage measurement; direct extraction; field effect transistor current sources; microwave current waveform measurement; microwave voltage waveform measurements; nonlinear FET I-V functions; reflective load-pull termination; time domain large signal measurements; two port nonlinear FET current sources;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981449
Filename
729845
Link To Document