Title :
Experimental verification of the link between timing jitter and phase noise
Author :
Samori, C. ; Lacaita, A.L. ; Zanchi, A. ; Pizzolato, F.
Author_Institution :
Dipt. di Elettronica, Politecnico di Milano, Italy
fDate :
10/15/1998 12:00:00 AM
Abstract :
A simple and intuitive derivation is presented of the relationship between the single sideband to carrier ratio and the timing jitter of the period of an oscillator. This link is then experimentally verified using a CMOS ring oscillator. The timing jitter of the period was measured with a time to amplitude converter
Keywords :
CMOS integrated circuits; circuit noise; jitter; oscillators; phase noise; timing; CMOS ring oscillator; SSCR performance; experimental verification; jitter period measurement; phase noise; single sideband to carrier ratio; time to amplitude converter; timing jitter;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981419
