Title :
Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies
Author :
Li, Di-Jie ; Free, C.E. ; Pitt, K.E.G. ; Barnwell, P.G.
Author_Institution :
Middlesex Univ., London
fDate :
10/15/1998 12:00:00 AM
Abstract :
A novel technique, using a cavity perturbation method, for measuring the relative permittivity of dielectric thick-film materials is presented. Measurement data have been obtained at X-band frequencies for two kinds of dielectric thick-film material. The method combines simplicity with high accuracy and has the potential to measure films as thin as 20 μm
Keywords :
dielectric materials; microwave measurement; permittivity measurement; thick films; X-band; cavity perturbation method; dielectric constant measurement; microwave frequency; relative permittivity; thick film dielectric material;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981392
