A Low-Power Single-Clock-Driven Scan Driver Using Depletion-Mode a-IGZO TFTs

Author

Yoo, Seung-Jin ; Hong, Sung-Jin ; Kang, Jin-Seong ; In, Hai-Jung ; Kwon, Oh-Kyong

Author_Institution

Dept. of Inf. Display Eng., Hanyang Univ., Seoul, South Korea

Volume

33

Issue

3

fYear

2012

fDate

3/1/2012 12:00:00 AM

Firstpage

402

Lastpage

404

Abstract

A new low-power scan driver using amorphous In-Ga-Zn-O (a-IGZO) thin-film transistor (TFT) is proposed. The proposed scan driver employs only one-clock signal and connects power supply voltage to the drain node of pull-up TFTs in the output stage to reduce the power consumption. The measured power consumption of the proposed scan driver of ten stages is 265 μW at an output voltage of 20 V and a clock frequency of 46.1 kHz, which is the driving condition of the extended graphics array (1024 × 768) panel. The power consumption is less than 11.9% of the previously reported results.

Keywords

clocks; driver circuits; gallium compounds; indium compounds; low-power electronics; thin film transistors; zinc compounds; InGaZnO; depletion-mode a-IGZO TFT; low-power single-clock-driven scan driver; one-clock signal; power 265 muW; power consumption; power supply voltage; thin-film transistor; voltage 20 V; Clocks; Frequency measurement; Logic gates; Power demand; Thin film transistors; Voltage measurement; Depletion mode; In–Ga–Zn–O; scan driver; thin-film transistor (TFT);

fLanguage

English

Journal_Title

Electron Device Letters, IEEE

Publisher

ieee

ISSN

0741-3106

Type

jour

DOI

10.1109/LED.2011.2181482

Filename

6151012