DocumentCode :
1445293
Title :
A Low-Power Single-Clock-Driven Scan Driver Using Depletion-Mode a-IGZO TFTs
Author :
Yoo, Seung-Jin ; Hong, Sung-Jin ; Kang, Jin-Seong ; In, Hai-Jung ; Kwon, Oh-Kyong
Author_Institution :
Dept. of Inf. Display Eng., Hanyang Univ., Seoul, South Korea
Volume :
33
Issue :
3
fYear :
2012
fDate :
3/1/2012 12:00:00 AM
Firstpage :
402
Lastpage :
404
Abstract :
A new low-power scan driver using amorphous In-Ga-Zn-O (a-IGZO) thin-film transistor (TFT) is proposed. The proposed scan driver employs only one-clock signal and connects power supply voltage to the drain node of pull-up TFTs in the output stage to reduce the power consumption. The measured power consumption of the proposed scan driver of ten stages is 265 μW at an output voltage of 20 V and a clock frequency of 46.1 kHz, which is the driving condition of the extended graphics array (1024 × 768) panel. The power consumption is less than 11.9% of the previously reported results.
Keywords :
clocks; driver circuits; gallium compounds; indium compounds; low-power electronics; thin film transistors; zinc compounds; InGaZnO; depletion-mode a-IGZO TFT; low-power single-clock-driven scan driver; one-clock signal; power 265 muW; power consumption; power supply voltage; thin-film transistor; voltage 20 V; Clocks; Frequency measurement; Logic gates; Power demand; Thin film transistors; Voltage measurement; Depletion mode; In–Ga–Zn–O; scan driver; thin-film transistor (TFT);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2181482
Filename :
6151012
Link To Document :
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