• DocumentCode
    1445309
  • Title

    Combination of beam propagation method and mode expansion propagation method for bidirectional optical beam propagation analysis

  • Author

    Hayashi, Kohtaro ; Koshiba, Masanori ; Tsuji, Yasuhide ; Yoneta, Susumu ; Kaji, Ryosaku

  • Author_Institution
    Div. of Electron. & Inf. Eng., Hokkaido Univ., Sapporo, Japan
  • Volume
    16
  • Issue
    11
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    2040
  • Lastpage
    2045
  • Abstract
    A combined method of the beam propagation method (BPM) and the mode expansion propagation method (MEPM) is proposed for the analysis of reflections of both transverse electric (TE) and transverse magnetic (TM) polarized waves in waveguiding structures containing longitudinal discontinuities. BPM based on the finite-element method (FEM) is applied to slowly varying regions and MEPM is applied only to regions including abrupt discontinuities. FEM is also utilized for evaluating the eigenmodes necessary for the MEPM analysis. To show the validity and usefulness of the present approach, numerical examples for a semiconductor laser facet with antireflection coating and an optical directional coupler are presented
  • Keywords
    antireflection coatings; finite element analysis; optical directional couplers; optical films; optical waveguide theory; semiconductor lasers; waveguide lasers; BPM; FEM; TE polarised waves; TM polarized waves; abrupt discontinuities; antireflection coating; beam propagation method; directional optical beam propagation analysis; eigenmodes; finite-element method; longitudinal discontinuities; mode expansion propagation method; optical directional coupler; reflections; semiconductor laser facet; slowly varying regions; waveguiding structures; Coatings; Directional couplers; Finite element methods; Magnetic analysis; Optical beams; Optical propagation; Optical reflection; Optical waveguides; Semiconductor lasers; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.730368
  • Filename
    730368