DocumentCode
1445375
Title
Vapor–Solid–Solid Growth of NiSi
Nanocrystals for Memory Application
Author
Li, Bei ; Liu, Jianlin ; Gann, Reuben D. ; Yarmoff, Jory A. ; Zhu, Yu
Author_Institution
Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
Volume
10
Issue
5
fYear
2011
Firstpage
1120
Lastpage
1125
Abstract
NiSi2 nanocrystals were synthesized by vapor-solid-solid process, introducing SiH4 onto Ni catalyst dots on a SiO2 substrate, for nonvolatile memory applications. Electron microscopy was used to characterize the morphology and X-ray photoelectron spectroscopy characterization confirmed the nature of these NiSi2 nanocrystals. mosfet memory with NiSi2 nanocrystal as floating gate was fabricated and fast programming/erasing speed, long retention, and 105 times of operation endurance performances were demonstrated.
Keywords
MOSFET; X-ray photoelectron spectra; electron microscopy; nanofabrication; nanostructured materials; nickel compounds; random-access storage; MOSFET memory; NiSi2; SiO2; X-ray photoelectron spectroscopy; catalyst dot; electron microscopy; erasing speed; floating gate; morphology; nanocrystals; nonvolatile memory; operation endurance performance; programming speed; retention performance; vapor-solid-solid growth; Logic gates; Nanocrystals; Nickel; Nonvolatile memory; Programming; Silicon; Threshold voltage; NiSi$_2$ nanocrystals; nonvolatile memory; vapor–solid–solid;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2011.2112774
Filename
5710426
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