• DocumentCode
    1445375
  • Title

    Vapor–Solid–Solid Growth of NiSi _2 Nanocrystals for Memory Application

  • Author

    Li, Bei ; Liu, Jianlin ; Gann, Reuben D. ; Yarmoff, Jory A. ; Zhu, Yu

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
  • Volume
    10
  • Issue
    5
  • fYear
    2011
  • Firstpage
    1120
  • Lastpage
    1125
  • Abstract
    NiSi2 nanocrystals were synthesized by vapor-solid-solid process, introducing SiH4 onto Ni catalyst dots on a SiO2 substrate, for nonvolatile memory applications. Electron microscopy was used to characterize the morphology and X-ray photoelectron spectroscopy characterization confirmed the nature of these NiSi2 nanocrystals. mosfet memory with NiSi2 nanocrystal as floating gate was fabricated and fast programming/erasing speed, long retention, and 105 times of operation endurance performances were demonstrated.
  • Keywords
    MOSFET; X-ray photoelectron spectra; electron microscopy; nanofabrication; nanostructured materials; nickel compounds; random-access storage; MOSFET memory; NiSi2; SiO2; X-ray photoelectron spectroscopy; catalyst dot; electron microscopy; erasing speed; floating gate; morphology; nanocrystals; nonvolatile memory; operation endurance performance; programming speed; retention performance; vapor-solid-solid growth; Logic gates; Nanocrystals; Nickel; Nonvolatile memory; Programming; Silicon; Threshold voltage; NiSi$_2$ nanocrystals; nonvolatile memory; vapor–solid–solid;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2011.2112774
  • Filename
    5710426