Title :
Programmable neural logic
Author :
Bohossian, Vasken ; Hasler, Paul ; Bruck, Jehoshua
Author_Institution :
Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125-0001 USA
Abstract :
Circuits of threshold elements (Boolean input, Boolean output neurons) have been shown to be surprisingly powerful. Useful functions such as XOR, ADD and MULTIPLY can be implemented by such circuits more efficiently than by traditional AND/OR circuits. In view of that, we have designed and built a programmable threshold element. The weights are stored on polysilicon floating gates, providing long-term retention without refresh. The weight value is increased using tunneling and decreased via hot electron injection. A weight is stored on a single transistor allowing the development of dense arrays of threshold elements. A 16-input programmable neuron was fabricated in the standard 2 μm double-poly, analog process available from MOSIS. We also designed and fabricated the multiple threshold element introduced in [5]. It presents the advantage of reducing the area of the layout from O(n2) to O(n), (n being the number of variables) for a broad class of Boolean functions, in particular symmetric Boolean functions such as PARITY. A long term goal of this research is to incorporate programmable single/multiple threshold elements, as building blocks in field programmable gate arrays.
Keywords :
electroless deposition; flip-chip devices; integrated circuit reliability; lead alloys; soldering; tin alloys; NiP-Au; PbSn; deposition technology; diameter distribution; maskless bump process; nucleation conditions; printed wiring boards; pulse amplitude; pulse length; reliability tests; solder bumps; solder droplets; underfill; wettable bond-pad metallizations; Degradation; Glass; Metallization; Piezoelectric actuators; Production equipment; Rough surfaces; Sputtering; Surface roughness; Wafer bonding; Zinc; Boolean functions; circuit complexity; digital logic; floating gate; hot electron injection; threshold logic; tunneling;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on