Title :
Characteristic analysis of coupled HTS interconnects with two-dimensional FDTD
Author :
Mao, Jun-Fa ; Qian, Xiaoning ; Yuan, Zhengyu
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiaotong Univ., China
Abstract :
In this work, the frequency-dependent RLGC parameters of high-speed coupled high T/sub c/ superconductor (HTS) interconnects are extracted with a two-dimensional (2-D) FDTD algorithm. The response signals of an HTS interconnect circuit and a normal Al interconnect circuit are simulated and compared, showing that not only the signal dispersion, delay, and magnitude decay of HTS interconnects are smaller than that of Al interconnects, the crosstalk of HTS interconnects is much smaller, too.
Keywords :
VLSI; coupled transmission lines; crosstalk; delays; electromagnetic field theory; finite difference time-domain analysis; high-speed integrated circuits; high-temperature superconductors; integrated circuit interconnections; superconducting transmission lines; 2D FDTD algorithm; HTSC interconnections; VLSI interconnects; characteristic analysis; coupled HTS interconnects; crosstalk; frequency-dependent RLGC parameters; high T/sub c/ superconductor interconnects; high-speed coupled interconnects; parameters extraction; response signals; signal delay; signal dispersion; signal magnitude decay; two-dimensional FDTD analysis; Circuit simulation; Coupling circuits; Crosstalk; Delay; Finite difference methods; Frequency; High temperature superconductors; Integrated circuit interconnections; Time domain analysis; Two dimensional displays;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/7260.905960
