• DocumentCode
    1445995
  • Title

    Accurately Handle Don´t-Care Conditions in High-Level Designs and Application for Reducing Initialized Registers

  • Author

    Chou, Hong-Zu ; Chang, Kai-Hui ; Kuo, Sy-Yen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    29
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    646
  • Lastpage
    651
  • Abstract
    Don´t-care conditions are utilized by many synthesis tools because such conditions provide additional flexibility for logic optimization. However, most techniques only focus on the gate level because it is difficult to handle such conditions accurately at behavior and register transfer levels. This is problematic since the trend is to move toward high-level synthesis. In this paper, we propose innovative methods to handle such conditions accurately at high-level designs. In addition, we propose three novel algorithms based on our new methods to minimize the number of registers that need to be initialized, which can reduce the routing resources used by the reset signals and alleviate the routing problem. We applied our techniques to a five-stage pipelined processor and successfully reduced the number of control registers that need to be initialized by 53%, demonstrating the effectiveness of our approach.
  • Keywords
    optimising compilers; pipeline processing; control registers; don´t-care conditions; five-stage pipelined processor; gate level; initialized registers design; logic optimization; register transfer levels; reset signals; routing resources; synthesis tools; Councils; Design optimization; Distributed control; High level synthesis; Logic design; Power generation economics; Registers; Routing; Signal synthesis; Technological innovation; Don´t-care (DC); initialized register reduction; symbolic simulation; synthesis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2010.2042905
  • Filename
    5433750