• DocumentCode
    1446103
  • Title

    Uncertainty Analysis in Photovoltaic Cell Parameter Estimation

  • Author

    Attivissimo, Filippo ; Nisio, Attilio Di ; Savino, Mario ; Spadavecchia, Maurizio

  • Author_Institution
    Dipt. di Elettrotec. ed Elettron. (DEE), Politec. di Bari, Bari, Italy
  • Volume
    61
  • Issue
    5
  • fYear
    2012
  • fDate
    5/1/2012 12:00:00 AM
  • Firstpage
    1334
  • Lastpage
    1342
  • Abstract
    This paper describes a theoretical approach to evaluate the uncertainty on the series and shunt resistances estimated by the seven-parameter (double diode) model of a photovoltaic (PV) cell using data commonly provided by panel manufacturers, measured environmental parameters, and semiempirical equations. After a brief survey on the state of the art and the treatment of the double-diode model, the procedure proposed by the authors, to estimate the unknown parameters, is illustrated. The theoretical expression of the uncertainty, which affects the estimation of the series and shunt resistances (namely, and ) of a PV cell, is then derived. A statistical analysis performed by means of a Monte Carlo simulation is in agreement with the theoretical expression of the uncertainty.
  • Keywords
    Monte Carlo methods; diodes; parameter estimation; photovoltaic cells; solar cells; statistical analysis; Monte Carlo simulation; PV cell; double-diode model treatment; environmental parameter measurement; panel manufacturers; photovoltaic cell parameter estimation; semiempirical equation; series resistance estimation; shunt resistance estimation; statistical analysis; uncertainty analysis; uncertainty evaluation; Equations; Estimation; Mathematical model; Measurement uncertainty; Resistance; Uncertainty; Voltage measurement; Characterization; Levenberg–Marquardt algorithm (LMA); Monte Carlo simulation; optimization algorithm; photovoltaic (PV) cell model; uncertainty; validation;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2012.2183429
  • Filename
    6151143