Title :
An analysis of network I/O workloads in virtualized cloud environment
Author :
Pu Xing ; Yang Miao ; Dai Chao ; Lai Xingjun ; Liu Mengxiao ; Hu Jingjing
Author_Institution :
State Radio Monitoring Center, Beijing, China
Abstract :
Nowadays, cloud computing is becoming a more and more prevalent platform to provide web services securely and conveniently in current data centers. For many well-known advantages, system virtualization turns to be a mainstream technology to build underlying infrastructures for cloud computing environment. Among a number of state-of-the-art Virtual Machine Monitors (VMMs), Xen is definitely to be a conspicuous hypervisor based VMM. However, there still lacks of in-depth understanding of the efficiency of I/O communication among multiple Virtual Machines (VMs) in both academic and industry areas, especially the burdensome network I/O workloads. In this paper, mathematical modeling methods are adopted to calculate the exchanged memory pages accurately in Xen I/O channel. According to our elaborately designed experimental evaluations, the proposed two equations could predict the number of exchanged memory pages around an average error rate of 6%, even in multiple VMs scenario. Meanwhile, we also analyzed the effects of varying MTU (Maximum Transmission Unit) size based on the theoretical analysis. Afterward, an effective optimization for network I/O performance is proposed in this paper as well.
Keywords :
Web services; cloud computing; virtual machines; virtualisation; I/O communication; MTU; Web services; Xen I/O channel; cloud computing environment; conspicuous hypervisor based VMM; data centers; mathematical modeling methods; maximum transmission unit size; network I/O workload analysis; virtual machine monitors; virtualized cloud environment; Cloud computing; Equations; Error analysis; Mathematical model; Virtual machine monitors; Virtual machining; Virtualization; Cloud Computing; I/O; Virtualization; Xen;
Conference_Titel :
Information Science, Electronics and Electrical Engineering (ISEEE), 2014 International Conference on
Conference_Location :
Sapporo
Print_ISBN :
978-1-4799-3196-5
DOI :
10.1109/InfoSEEE.2014.6947780