DocumentCode
1446140
Title
Effects of Laser Surface Modification on Secondary Electron Emission of Copper
Author
Watts, Christopher ; Gilmore, Mark ; Schamiloglu, Edl
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
Volume
39
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
836
Lastpage
841
Abstract
The effects of surface roughness on secondary electron emission (SEE) are investigated for copper. The surface of the copper samples was modified using a high-power neodymium-doped yttrium aluminum garnet laser, where the degree of surface modification depended on the duration and intensity of the laser exposure. Four different levels of modification were tested, in addition to the unmodified sample. Minor modification resulted in the biggest effect, significantly reducing the SEE. However, this effect only holds true for very low electron dose, where dose is the incident charge per unit area. For higher dose levels, those that are commensurate with “technical materials” in applied situations, there was a negligible effect of surface roughness on SEE. The data set presented here seeks to quantify the effect of surface roughness with further gradations than what is accounted for in the semiempirical formulas in the literature.
Keywords
copper; laser materials processing; secondary electron emission; surface roughness; surface treatment; Cu; Nd:YAG laser; electron dose; laser exposure; laser surface modification; secondary electron emission; surface roughness; Carbon; Copper; Materials; Measurement by laser beam; Rough surfaces; Surface roughness; Surface treatment; Depressed collector; dose effect; high-power microwaves (HPMs); laser–material interaction; secondary electron emission (SEE);
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2010.2102750
Filename
5710586
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