DocumentCode :
1446140
Title :
Effects of Laser Surface Modification on Secondary Electron Emission of Copper
Author :
Watts, Christopher ; Gilmore, Mark ; Schamiloglu, Edl
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
Volume :
39
Issue :
3
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
836
Lastpage :
841
Abstract :
The effects of surface roughness on secondary electron emission (SEE) are investigated for copper. The surface of the copper samples was modified using a high-power neodymium-doped yttrium aluminum garnet laser, where the degree of surface modification depended on the duration and intensity of the laser exposure. Four different levels of modification were tested, in addition to the unmodified sample. Minor modification resulted in the biggest effect, significantly reducing the SEE. However, this effect only holds true for very low electron dose, where dose is the incident charge per unit area. For higher dose levels, those that are commensurate with “technical materials” in applied situations, there was a negligible effect of surface roughness on SEE. The data set presented here seeks to quantify the effect of surface roughness with further gradations than what is accounted for in the semiempirical formulas in the literature.
Keywords :
copper; laser materials processing; secondary electron emission; surface roughness; surface treatment; Cu; Nd:YAG laser; electron dose; laser exposure; laser surface modification; secondary electron emission; surface roughness; Carbon; Copper; Materials; Measurement by laser beam; Rough surfaces; Surface roughness; Surface treatment; Depressed collector; dose effect; high-power microwaves (HPMs); laser–material interaction; secondary electron emission (SEE);
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2010.2102750
Filename :
5710586
Link To Document :
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