DocumentCode
144622
Title
Investigating flicker noise effect on randomness of CMOS ring oscillator based true random number generators
Author
Guler, Urcan ; Pusane, Ali E. ; Dundar, Gunhan
Author_Institution
UEKAE, TUBITAK, Kocaeli, Turkey
Volume
2
fYear
2014
fDate
26-28 April 2014
Firstpage
845
Lastpage
849
Abstract
The effect of flicker noise on randomness is one of the most controversial topics in random number generation. Flicker noise is random in nature; however, its power spectral density (PSD) exhibits a colored distribution, which indicates correlation between adjacent samples. The use of flicker noise for random number generation is risky (unlike white noise) due to its colored nature. Sampling is inevitable in random number generation and its effects should be taken into consideration. In addition, flicker noise gets folded during the sampling process, which leads to changes in its spectral properties. In this paper, the effects of flicker noise are investigated in order to address its usefulness for random number generation. The results show that flicker noise has positive effect on increasing the entropy in CMOS Ring Oscillator (RO) based Random Number Generators (RNGs).
Keywords
CMOS integrated circuits; flicker noise; integrated circuit noise; oscillators; random number generation; white noise; CMOS ring oscillator; flicker noise effect; power spectral density; random number generation; random number generators; risky; white noise; 1f noise; Entropy; Generators; Jitter; Ring oscillators; White noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Science, Electronics and Electrical Engineering (ISEEE), 2014 International Conference on
Conference_Location
Sapporo
Print_ISBN
978-1-4799-3196-5
Type
conf
DOI
10.1109/InfoSEEE.2014.6947786
Filename
6947786
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