• DocumentCode
    1446741
  • Title

    Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch

  • Author

    Bastani, Pouria ; Callegari, Nicholas ; Wang, Li.-C. ; Abadir, Magdy S.

  • Volume
    27
  • Issue
    3
  • fYear
    2010
  • Firstpage
    42
  • Lastpage
    53
  • Abstract
    For sub-65-nm design, many timing effects, if not explicitly and accurately modeled and simulated, can result in an unexpected timing mismatch between simulated and observed timing behavior on silicon chips. We describe a feature-ranking methodology to analyze and rank potential design-related issues, explaining how diverse features can be used to encode the potential design issues and how features can be interpreted properly.
  • Keywords
    elemental semiconductors; integrated circuit design; silicon; Si; design-silicon timing mismatch diagnosis; feature-ranking methodology; rank potential design; design and test; statistical diagnosis; statistical learning; timing mismatch;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2009.95
  • Filename
    5255200