DocumentCode
1446741
Title
Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch
Author
Bastani, Pouria ; Callegari, Nicholas ; Wang, Li.-C. ; Abadir, Magdy S.
Volume
27
Issue
3
fYear
2010
Firstpage
42
Lastpage
53
Abstract
For sub-65-nm design, many timing effects, if not explicitly and accurately modeled and simulated, can result in an unexpected timing mismatch between simulated and observed timing behavior on silicon chips. We describe a feature-ranking methodology to analyze and rank potential design-related issues, explaining how diverse features can be used to encode the potential design issues and how features can be interpreted properly.
Keywords
elemental semiconductors; integrated circuit design; silicon; Si; design-silicon timing mismatch diagnosis; feature-ranking methodology; rank potential design; design and test; statistical diagnosis; statistical learning; timing mismatch;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2009.95
Filename
5255200
Link To Document