• DocumentCode
    1446791
  • Title

    High field effects in solid dielectrics

  • Author

    Boggs, Steven ; Kuang, Jinbo

  • Author_Institution
    Electr. Insulation Res. Center, Connecticut Univ., Storrs, CT, USA
  • Volume
    14
  • Issue
    6
  • fYear
    1998
  • Firstpage
    5
  • Lastpage
    12
  • Abstract
    High voltage solid dielectrics are employed in a wide range of electrotechnology, from video flyback transformers to transmission-class solid dielectric cables. The design criteria for the application of such dielectrics are well developed, and failure is primarily the result of unanticipated defects. In this context, a defect is anything that causes an electric field that is substantially greater than the design field. Thus the reliability of high voltage dielectrics is tied closely to high field effects, typically in microscopic volumes around defects such as asperities on a conductor or small cavities.
  • Keywords
    electrical conductivity; insulating materials; trees (electrical); voids (solid); asperities; cavities; electric field; electrotechnology; failure; high field effects; microscopic volumes; reliability; solid dielectrics; Amorphous materials; Cables; Conductivity; Dielectrics; Geometry; Impurities; Photonic band gap; Polymers; Solids; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0883-7554
  • Type

    jour

  • DOI
    10.1109/57.730802
  • Filename
    730802