Title :
Writing and detecting bits at 100 Gbit/in2 in longitudinal magnetic recording media
Author :
Moser, A. ; Rettner, C.T. ; Best, M.E. ; Fullerton, E.E. ; Weller, D. ; Parker, M. ; Doerner, M.F.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
We have written bits in longitudinal media at extremely high areal densities, >100, using a focused ion beam (FIB) trimmed write head mounted on a static write/read tester. Bits were written at a track pitch of ~100 nm and with a 62.5 transition spacing with the same trimmed write head. The bits were characterized with the head read sensor and also with magnetic force microscopy (MFM). The MFM images were analyzed with respect to transition position jitter, signal-to-noise, and track width
Keywords :
focused ion beam technology; magnetic force microscopy; magnetic heads; magnetic recording; bit aspect ratio; focused ion beam trimming; head read sensor; high density recording; longitudinal magnetic recording; magnetic force microscopy; narrow track; signal-to-noise ratio; static write/read tester; transition position jitter; write head; Focusing; Image analysis; Ion beams; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic sensors; Sensor phenomena and characterization; Testing; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
