• DocumentCode
    144696
  • Title

    Influence of cap-and-pin disc insulator profile on contamination flashover voltage

  • Author

    Xinzhe Yu ; Jun Zhou ; Bo Liu ; Ruiping Huang ; Zhiyi Su

  • Author_Institution
    High Voltage Dept., China Electr. Power Res. Inst. (CEPRI), Beijing, China
  • Volume
    2
  • fYear
    2014
  • fDate
    26-28 April 2014
  • Firstpage
    1025
  • Lastpage
    1029
  • Abstract
    EHV and UHV projects can satisfy long-distance and high-capacity transmission demand of a.c. line. Projects in higher voltage level need insulators with higher mechanical load, whose structure height, diameter and other parameters are different from the parameters before. The influence of profile on contamination flashover characteristic is important for insulation selection and worthy to research. In this paper, 50% probable pollution flashover voltages of eighteen various profile cap-and-pin disc insulators at SDD=0.05mg/cm2 and SDD=0.1mg/cm2 are obtained separately by up-and-down method, in three fog chambers at China Electric Power Research Institute (CEPRI). The influence of cap-and-pin disc insulator profile on contamination flashover voltage are proposed. According to test results, outer sheds profile has better performance than under-ribs one. Moreover, specified creepage distance cannot be the only factor to be considered in outdoor insulation. Besides, outdoor insulation selection and dimensioning approaches are also discussed in this paper.
  • Keywords
    contamination; flashover; insulators; power transmission; CEPRI; China Electric Power Research Institute; EHV projects; UHV projects; cap-and-pin disc insulator profile; contamination flashover voltage; fog chambers; insulation selection; mechanical load; pollution flashover voltages; transmission demand; Contamination; Flashover; IEC standards; Insulators; Pollution; Stress; contamination flashover; creepage factor; high voltage AC; insulator profile; outdoor insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Science, Electronics and Electrical Engineering (ISEEE), 2014 International Conference on
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4799-3196-5
  • Type

    conf

  • DOI
    10.1109/InfoSEEE.2014.6947824
  • Filename
    6947824