DocumentCode
144696
Title
Influence of cap-and-pin disc insulator profile on contamination flashover voltage
Author
Xinzhe Yu ; Jun Zhou ; Bo Liu ; Ruiping Huang ; Zhiyi Su
Author_Institution
High Voltage Dept., China Electr. Power Res. Inst. (CEPRI), Beijing, China
Volume
2
fYear
2014
fDate
26-28 April 2014
Firstpage
1025
Lastpage
1029
Abstract
EHV and UHV projects can satisfy long-distance and high-capacity transmission demand of a.c. line. Projects in higher voltage level need insulators with higher mechanical load, whose structure height, diameter and other parameters are different from the parameters before. The influence of profile on contamination flashover characteristic is important for insulation selection and worthy to research. In this paper, 50% probable pollution flashover voltages of eighteen various profile cap-and-pin disc insulators at SDD=0.05mg/cm2 and SDD=0.1mg/cm2 are obtained separately by up-and-down method, in three fog chambers at China Electric Power Research Institute (CEPRI). The influence of cap-and-pin disc insulator profile on contamination flashover voltage are proposed. According to test results, outer sheds profile has better performance than under-ribs one. Moreover, specified creepage distance cannot be the only factor to be considered in outdoor insulation. Besides, outdoor insulation selection and dimensioning approaches are also discussed in this paper.
Keywords
contamination; flashover; insulators; power transmission; CEPRI; China Electric Power Research Institute; EHV projects; UHV projects; cap-and-pin disc insulator profile; contamination flashover voltage; fog chambers; insulation selection; mechanical load; pollution flashover voltages; transmission demand; Contamination; Flashover; IEC standards; Insulators; Pollution; Stress; contamination flashover; creepage factor; high voltage AC; insulator profile; outdoor insulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Science, Electronics and Electrical Engineering (ISEEE), 2014 International Conference on
Conference_Location
Sapporo
Print_ISBN
978-1-4799-3196-5
Type
conf
DOI
10.1109/InfoSEEE.2014.6947824
Filename
6947824
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