Title :
Variational Capacitance Extraction and Modeling Based on Orthogonal Polynomial Method
Author :
Shen, Ruijing ; Tan, Sheldon X D ; Cui, Jian ; Yu, Wenjian ; Cai, Yici ; Chen, Geng-Sheng
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
Abstract :
In this paper, we propose a novel statistical capacitance extraction method for interconnect conductors considering process variations. The new method is called statCap, where orthogonal polynomials are used to represent the statistical processes in a deterministic way. We first show how the variational potential coefficient matrix is represented in a first-order form using Taylor expansion and orthogonal decomposition. Then, an augmented potential coefficient matrix, which consists of the coefficients of the polynomials, is derived. After this, corresponding augmented system is solved to obtain the variational capacitance values in the orthogonal polynomial form. Finally, we present a method to extend statCap to the second-order form to give more accurate results without loss of efficiency compared to the linear models. We show the derivation of the analytic second-order orthogonal polynomials for the variational capacitance integral equations. Experimental results show that statCap is two orders of magnitude faster than the recently proposed statistical capacitance extraction method based on the spectral stochastic collocation approach and many orders of magnitude faster than the Monte Carlo method for several practical conductor structures.
Keywords :
Monte Carlo methods; capacitance; conductors (electric); integral equations; integrated circuit interconnections; polynomials; Monte Carlo method; Taylor expansion; augmented potential coefficient matrix; conductor structures; interconnect conductors; orthogonal decomposition; orthogonal polynomial method; process variation; spectral stochastic collocation; statCap; statistical capacitance extraction; variational capacitance extraction; variational capacitance integral equations; variational potential coefficient matrix; Capacitance; Conductors; Integral equations; Integrated circuit interconnections; Matrix decomposition; Polynomials; Sampling methods; Stochastic processes; Taylor series; Very large scale integration; Capacitance extraction; orthogonal decomposition; orthogonal polynomial; process variations;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2009.2025378