Title :
Effects of Ta addition in CoCrTa intermediate layer on Co-alloy thin film media
Author :
Huang, Lei ; Wang, Jian Ping ; Soo, Eng Wei
Author_Institution :
Data Storage Inst., Singapore
fDate :
9/1/2000 12:00:00 AM
Abstract :
The Ta content in the CoCrTax intermediate layer effectively influences the crystallographic texture, the grain size and the magnetic properties of NiAl/CrV/CoCrTa/CoCrTaPt thin film media. The thin film media have a preferred in-plane Co (10.0) texture and about 10 nm of mean grain size with more uniform distribution, when the Ta content is in the range of 0-5 at.%. Once Ta content exceeds 7 at.%, the texture of the Co-alloy changed from in-plane to out-of-plane, the grain size increased with wide distribution and the coercivity decreased dramatically. It was found that the grain size becomes small; coercivity, exchange decoupling and thermal stability increase; and the switching volume is reasonably small as the Ta content is increased from 0 to 5 at.%
Keywords :
aluminium alloys; chromium alloys; cobalt alloys; coercive force; exchange interactions (electron); grain size; magnetic multilayers; magnetic recording; magnetic switching; magnetic thin films; nickel alloys; platinum alloys; stoichiometry; tantalum alloys; texture; thermal stability; vanadium alloys; 10 nm; Co-alloy thin film media; CoCrTa intermediate layer; NiAl-CrV-CoCrTa-CoCrTaPt; NiAl/CrV/CoCrTa/CoCrTaPt thin film media; Ta addition; Ta content; coercivity; crystallographic texture; exchange decoupling; grain size; in-plane Co texture; in-plane texture; magnetic properties; mean grain size; out-of-plane texture; switching volume; thermal stability; uniform distribution; Chemical analysis; Chromium; Coercive force; Crystallography; Grain size; Magnetic films; Magnetic properties; Sputtering; Substrates; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on