Title :
Effect of CrRu underlayer on the magnetic, recording, and thermal stability characteristics of CoCrPtTa thin film media
Author :
Malhotra, Sudhir S. ; Stafford, Donald C. ; Lal, Brij B. ; Russak, Michael A.
Author_Institution :
HMT Technol., Freemont, CA, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
The effects of CrRu underlayers on the grain size, lattice matching, magnetic, recording and thermal stability characteristics for CoCrPtTa thin film media are presented, CrRu10 and CrRu20 underlayers produced about 800-960 Oe higher coercivity compared to media with a Cr underlayer. At 300 kfci recording density the CoCrPtTa/CrRu media has about 10-15% lower media noise and about 1-1.5 dB higher SNR compared to the similar media with Cr underlayer. X-ray diffraction data suggest somewhat better lattice matching between the CoCrPtTa/CrRu media due to the addition of Ru to the Cr underlayer compared to CoCrPtTa/Cr media. The CoCrPtTa/CrRu media has an average grain size of 12 nm in comparison to the average grain size of 15 nm for the CoCrPtTa/Cr media. The thin film media with CrRu 10 underlayer has smaller grain size but similar thermal stability performance compared to Cr underlayer
Keywords :
X-ray diffraction; chromium alloys; cobalt alloys; coercive force; grain size; interface structure; magnetic recording noise; magnetic thin films; platinum alloys; ruthenium alloys; tantalum alloys; thermal stability; 12 to 15 nm; CoCrPtTa; CoCrPtTa thin film media; CoCrPtTa/CrRu media; CrRu; CrRu underlayer; CrRu10; CrRu20; SNR; X-ray diffraction; average grain size; coercivity; grain size; lattice matching; magnetic characteristics; magnetic recording; media noise; recording; recording density; thermal stability; Chromium; Coercive force; Grain size; Lattices; Magnetic films; Magnetic recording; Signal to noise ratio; Thermal stability; Transistors; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
