• DocumentCode
    1447414
  • Title

    Crystallographic and magnetic properties of CoCrPt/Cr films produced by pulsed laser deposition

  • Author

    Shima, M. ; Ford, A.C. ; Ross, C.A.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., MIT, Cambridge, MA, USA
  • Volume
    36
  • Issue
    5
  • fYear
    2000
  • fDate
    9/1/2000 12:00:00 AM
  • Firstpage
    2321
  • Lastpage
    2323
  • Abstract
    The crystallographic structure and magnetic properties of CoCrPt(30 nm)/Cr(50 nm) films fabricated by pulsed laser deposition have been studied at various substrate temperatures and ion bombardment energies. Cr(002) texture is developed at 350–500° C where increased coercivity is observed from the Co-alloy layers, while Cr(110) texture is formed at 300° C. The average grain size of the Cr layers gradually increases with substrate temperature from ~10 nm to ~20 nm, which is comparable to that of sputtered films. A Cr(002) X-ray peak is not observed from films grown at 400° C with Ar ion bombardment (> 50 eV). The coercivity and squareness of the magnetic hysteresis loops decrease as the beam energy increases, which may be attributed to the absence of Cr(002) texture.
  • Keywords
    chromium; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; grain size; interface magnetism; magnetic hysteresis; magnetic recording; magnetic thin films; platinum alloys; pulsed laser deposition; surface texture; 10 to 20 nm; 30 nm; 300 C; 400 C; 50 nm; Co-alloy layers; CoCrPt-Cr; CoCrPt/Cr films; Cr; average grain size; beam energy; coercivity; crystallographic properties; crystallographic structure; ion bombardment energies; magnetic hysteresis loops; magnetic properties; pulsed laser deposition; squareness; substrate temperature; Argon; Chromium; Coercive force; Crystallography; Grain size; Magnetic films; Magnetic properties; Optical pulses; Pulsed laser deposition; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.908416
  • Filename
    908416