Correlation of stress and magnetic anisotropy in CoCrPt/Cr films grown on textured substrates

Author

Twisselmann, Douglas J. ; Shine, Yuh-Jer ; Ross, C.A.

Author_Institution

MIT, Cambridge, MA, USA

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2324

Lastpage

2326

Abstract

Stress in Cr and CoCrPt/Cr films grown on smooth and lithographically textured silicon substrates were studied to investigate the origins of magnetic anisotropy in grooved longitudinal magnetic recording media. Crystallographic texture changes from Cr(110) to Cr(200) orientations are correlated with large stress changes. Magnetostrictive effects due to stress anisotropy in grooved samples are explored.

Keywords

chromium; chromium alloys; cobalt alloys; ferromagnetic materials; interface magnetism; internal stresses; magnetic anisotropy; magnetic recording; magnetic thin films; magnetostriction; platinum alloys; surface texture; CoCrPt-Cr; CoCrPt/Cr films; Cr; crystallographic texture; grooved longitudinal magnetic recording media; grooved samples; lithographically textured silicon substrates; magnetic anisotropy; magnetostrictive effects; smooth silicon substrates; stress; stress anisotropy; textured substrates; Chromium; Crystallography; Magnetic anisotropy; Magnetic films; Magnetic recording; Magnetostriction; Perpendicular magnetic anisotropy; Semiconductor films; Silicon; Stress;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908417

Filename

908417