Title :
Measurements of the High Field Optical Nonlinearity and Electron Density in Gases: Application to Filamentation Experiments
Author :
Wahlstrand, Jared K. ; Chen, Yu-hsin ; Cheng, Yu-Hsiang ; Varma, Sanjay R. ; Milchberg, Howard M.
Author_Institution :
Inst. for Res. in Electron. & Appl. Phys., Univ. of Maryland, College Park, MD, USA
fDate :
6/1/2012 12:00:00 AM
Abstract :
We discuss recent experiments and calculations of the high-intensity optical nonlinearity in gases. Spectral interferometry measurements of the nonlinear optical response of air constituents to laser intensities near the ionization threshold are performed. A calculation of the phase shift caused by a plasma grating created by interference between the pump and probe beams in a transient birefringence measurement suggests that experimental techniques measuring cross phase modulation of a probe pulse by a strong pump pulse are unreliable for studying the optical nonlinearity when the pump and probe pulses are of the same wavelength. An interferometric measurement of the electron density in a filament is also performed. The peak elec-tron density measured is consistent with a model that includes plasma defocusing, but not higher-order Kerr terms. These tech-niques promise to improve the quantitative understanding of nonlinear optics near the ionization threshold and filamentation.
Keywords :
birefringence; interference; ionisation; nonlinear optics; optical pumping; plasma density; plasma diagnostics; plasma light propagation; plasma nonlinear processes; cross phase; electron density; filamentation experiment; high field optical nonlinearity; ionization threshold; laser intensity; nonlinear optical response; phase shift; plasma defocusing; plasma grating; spectral interferometry measurement; transient birefringence measurement; Ionization; Laser beams; Laser excitation; Measurement by laser beam; Plasma measurements; Plasmas; Probes; Femtosecond filamentation; Kerr effect; ionization; ultrafast optics;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2012.2187881