• DocumentCode
    1447451
  • Title

    Magnetic properties of nanostructured CoPt and FePt thin films

  • Author

    Jeong, Sangki ; Hsu, Yu-Nu ; Laughlin, David E. ; McHenry, Michael E.

  • Author_Institution
    Mater. Sci. & Eng. Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    36
  • Issue
    5
  • fYear
    2000
  • fDate
    9/1/2000 12:00:00 AM
  • Firstpage
    2336
  • Lastpage
    2338
  • Abstract
    Polycrystalline MgO underlayer films lead to different preferred orientations of L10 CoPt and FePt films after the annealing process, depending on the thickness of the L10 films. L10 films with a thickness greater than 20 nm revealed mostly L10 [100] fiber texture and consequently in-plane anisotropy as determined by magnetic hysteresis. Strong perpendicular anisotropy due to the L10 [001] fiber texture was obtained for thicknesses below 10 nm. The δM curve showed strong intergranular exchange coupling. The angular variation of coercivity showed the possibility of both domain wall motion and a rotational mechanism of magnetization reversal
  • Keywords
    annealing; cobalt alloys; coercive force; exchange interactions (electron); ferromagnetic materials; iron alloys; magnesium compounds; magnetic anisotropy; magnetic domain walls; magnetic hysteresis; magnetic thin films; magnetisation reversal; nanostructured materials; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum alloys; surface texture; 10 to 20 nm; CoPt; FePt; L10 [001] fiber texture; L10 [100] fiber texture; MgO; annealing process; coercivity; domain wall motion; in-plane anisotropy; intergranular exchange coupling; magnetic hysteresis; magnetic properties; magnetization reversal; nanostructured CoPt thin films; nanostructured FePt thin films; polycrystalline MgO underlayer films; preferred orientation; rotational mechanism; strong perpendicular anisotropy; thickness; Anisotropic magnetoresistance; Magnetic films; Magnetic properties; Magnetization reversal; Perpendicular magnetic recording; Rapid thermal annealing; Reflection; Sputtering; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.908421
  • Filename
    908421