DocumentCode :
1447609
Title :
Effect of soft magnetic underlayer on magnetization microstructure of perpendicular thin film media
Author :
Honda, Yukio ; Kikukawa, Atsushi ; Hirayama, Yoshiyuki ; Futamoto, Masaaki
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Volume :
36
Issue :
5
fYear :
2000
fDate :
9/1/2000 12:00:00 AM
Firstpage :
2399
Lastpage :
2401
Abstract :
Analytical magnetic force microscopy has been applied to investigate the relationship between the soft magnetic underlayer and the microscopic magnetization structures of double layered perpendicular media. The magnetization structures of the CoCrPtTa perpendicular media with Co-Nb-Zr, Co-Ta-Zr, Fe-Ta-C, and Fe-Al-Si soft magnetic underlayers are compared. The medium with Co-Ta-Zr underlayer shows low medium noise and high resolution characteristics at high recording densities. The magnetization irregularities of perpendicular media are strongly affected by the soft magnetic underlayer material
Keywords :
chromium alloys; cobalt alloys; magnetic force microscopy; magnetic recording noise; magnetic thin films; magnetisation; perpendicular magnetic recording; platinum alloys; soft magnetic materials; tantalum alloys; CoCrPtTa; CoCrPtTa perpendicular media; CoNbZr; CoTaZr; FeAlSi; FeTaC; analytical magnetic force microscopy; double layered perpendicular media; high recording densities; high resolution characteristics; low medium noise; magnetization microstructure; microscopic magnetization structures; perpendicular thin film media; soft magnetic underlayer; Amorphous magnetic materials; Magnetic films; Magnetic force microscopy; Magnetic noise; Magnetic recording; Microstructure; Perpendicular magnetic recording; Saturation magnetization; Soft magnetic materials; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.908445
Filename :
908445
Link To Document :
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