Title :
Period Extension and Randomness Enhancement Using High-Throughput Reseeding-Mixing PRNG
Author :
Li, Chung-Yi ; Chen, Yuan-Ho ; Chang, Tsin-Yuan ; Deng, Lih-Yuan ; To, Kiwing
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
We present a new reseeding-mixing method to extend the system period length and to enhance the statistical properties of a chaos-based logistic map pseudo random number generator (PRNG). The reseeding method removes the short periods of the digitized logistic map and the mixing method extends the system period length to 2253 by “xoring” with a DX generator. When implemented in the TSMC 0.18- μm 1P6M CMOS process, the new reseeding-mixing PRNG (RM-PRNG) attains the best throughput rate of 6.4 Gb/s compared with other nonlinear PRNGs. In addition, the generated random sequences pass the NIST SP 800-22 statistical tests including ratio test and U-value test.
Keywords :
CMOS logic circuits; random number generation; 1P6M CMOS process; chaos based logistic map pseudo random number generator; high throughput reseeding mixing PRNG; period extension; randomness enhancement; reseeding-mixing method; size 0.18 mum; statistical properties; system period length; Chaos; Cryptography; Generators; Hardware; Logic gates; NIST; Throughput; Chaotic map; mixing; period extension; pseudo random number generator (PRNG); reseeding;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2010.2103332