DocumentCode
1447702
Title
Timing Jitter and Modulation Profile Extraction for Spread-Spectrum Clocks
Author
Hsu, Jenchien ; Su, Chauchin
Author_Institution
Dept. of Electr. & Control Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Volume
59
Issue
4
fYear
2010
fDate
4/1/2010 12:00:00 AM
Firstpage
847
Lastpage
856
Abstract
This paper presents a built-in jitter measurement approach for measuring the timing jitter of spread-spectrum clocks (SSCs) and a jitter estimation method for validating the approach. Because of the lack of dedicated measurement instruments for SSC timing jitter measurement, the jitter estimation method is proposed to correlate SSC and non-SSC jitter. A 1.2-GHz eight-phase SSC generator with the jitter measurement circuit is designed and fabricated using the 0.18-??m complementary metal-oxide-semiconductor technology. The measured results are validated by the proposed estimation method, which is the key contribution of this paper. The experimental results show that the proposed built-in measurement approach has an error of less than 0.0026 UI.
Keywords
MIS devices; clocks; spread spectrum communication; built-in jitter measurement approach; built-in measurement approach; frequency 1.2 GHz; metal-oxide-semiconductor technology; modulation profile extraction; spread-spectrum clocks; timing jitter; Analog testing; built-in self test; jitter; jitter measurement; phase-locked loop (PLL); spread-spectrum clock (SSCs);
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2009.2025992
Filename
5256211
Link To Document