• DocumentCode
    1447702
  • Title

    Timing Jitter and Modulation Profile Extraction for Spread-Spectrum Clocks

  • Author

    Hsu, Jenchien ; Su, Chauchin

  • Author_Institution
    Dept. of Electr. & Control Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • Volume
    59
  • Issue
    4
  • fYear
    2010
  • fDate
    4/1/2010 12:00:00 AM
  • Firstpage
    847
  • Lastpage
    856
  • Abstract
    This paper presents a built-in jitter measurement approach for measuring the timing jitter of spread-spectrum clocks (SSCs) and a jitter estimation method for validating the approach. Because of the lack of dedicated measurement instruments for SSC timing jitter measurement, the jitter estimation method is proposed to correlate SSC and non-SSC jitter. A 1.2-GHz eight-phase SSC generator with the jitter measurement circuit is designed and fabricated using the 0.18-??m complementary metal-oxide-semiconductor technology. The measured results are validated by the proposed estimation method, which is the key contribution of this paper. The experimental results show that the proposed built-in measurement approach has an error of less than 0.0026 UI.
  • Keywords
    MIS devices; clocks; spread spectrum communication; built-in jitter measurement approach; built-in measurement approach; frequency 1.2 GHz; metal-oxide-semiconductor technology; modulation profile extraction; spread-spectrum clocks; timing jitter; Analog testing; built-in self test; jitter; jitter measurement; phase-locked loop (PLL); spread-spectrum clock (SSCs);
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2025992
  • Filename
    5256211