DocumentCode :
1447814
Title :
A 10-Bit 80-MS/s Decision-Select Successive Approximation TDC in 65-nm CMOS
Author :
Chung, Hayun ; Ishikuro, Hiroki ; Kuroda, Tadahiro
Author_Institution :
Keio Univ., Yokohama, Japan
Volume :
47
Issue :
5
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
1232
Lastpage :
1241
Abstract :
This paper presents a 10-bit 80-MS/s successive approximation time-to-digital converter (TDC) with a decision-select structure for on-chip timing measurement applications. Time-domain successive approximation is realized utilizing a relative timing difference between input and reference timings. While the successive approximation scheme allows high bit resolutions and low power consumptions, the decision-select structure enables fast bit conversions that lead to high sampling rates. The decision-select structure unrolls the successive approximation iteration loop and removes time-consuming timing estimation and adjustment procedures to minimize bit conversion times. As the successive approximation scheme relies on a binary search, exponential delay lines are adopted to achieve good power and noise performances by reducing the total number of delay stages. The proposed TDC uses only 0.048 delay stages per bit conversion. A test-chip prototype fabricated in a 65-nm CMOS technology consumes 9.6 mW at 80-MS/s and demonstrates 0.23-pJ/conversion-step figure-of merit (FOM) and 0.5-LSB single-shot precision.
Keywords :
CMOS integrated circuits; approximation theory; iterative methods; low-power electronics; measurement systems; time-digital conversion; CMOS; CMOS technology; FOM; binary search; bit conversion times minimization; chip timing measurement applications; decision-select structure; decision-select successive approximation TDC; delay stages per bit conversion; exponential delay lines; figure-of merit; high bit resolutions; high sampling rates; input timings; low power consumptions; noise performances; power 9.6 mW; power performances; reference timings; relative timing difference; size 65 nm; successive approximation iteration loop; test-chip prototype; time-consuming timing estimation removal; time-domain successive approximation; time-to-digital converter; word length 10 bit; Approximation methods; Calibration; Computer architecture; Decision support systems; Delay; Multiplexing; Decision-select; digital offset calibration; high resolution; high sampling rate; low power; successive approximation; time-to-digital converter (TDC);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2012.2184640
Filename :
6151852
Link To Document :
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