Exchange anisotropy and thermal stability of Mn-Ir-Pt exchange-biased layers

Author

Ro, Jae-Chul ; Kim, Young Keun ; Yoon, Seong-Yong ; Park, Joon-Hyuk ; Jeon, Dong-Min ; Suh, Su-Jeong

Author_Institution

R&D Center, Samsung Electro-Mech. Co., Suwon, South Korea

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2569

Lastpage

2571

Abstract

The exchange coupling and the microstructures of the Ta/(Ni-Fe,Co-Fe)/Mn-Ir-Pt/Ta multilayers have been investigated by varying the compositions of Mn-Ir-Pt film. For exchange-bias layer (EBL) comprising NiFe/CoFe/Mn_79.7Ir_18.4Pt_1.9 structures, the exchange bias field (H_ex) of 441 Oe (exchange energy Jex of 0.236 erg/cm²) and the blocking temperature (T _b) of 260°C was obtained. In addition, it is found that the Mn-Ir-Pt EBL´s have the polycrystalline structure and (111) texture. The crystallographic structure of the Mn-Ir-Pt film was face centered cubic (FCC)

Keywords

antiferromagnetic materials; exchange interactions (electron); iridium alloys; magnetic anisotropy; magnetic multilayers; magnetic thin films; manganese alloys; platinum alloys; thermal stability; Mn-Ir-Pt; Mn-Ir-Pt exchange biased layer; Ta/NiFe/CoFe/Mn_79.7Ir_18.4Pt_1.9/Ta multilayer; blocking temperature; crystallographic structure; exchange anisotropy; exchange energy; microstructure; polycrystalline antiferromagnetic film; texture; thermal stability; Anisotropic magnetoresistance; Antiferromagnetic materials; Corrosion; Magnetic materials; Magnetic properties; Magnetic sensors; Microstructure; Sensor phenomena and characterization; Temperature sensors; Thermal stability;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908512

Filename

908512