Title :
Exchange anisotropy and thermal stability of Mn-Ir-Pt exchange-biased layers
Author :
Ro, Jae-Chul ; Kim, Young Keun ; Yoon, Seong-Yong ; Park, Joon-Hyuk ; Jeon, Dong-Min ; Suh, Su-Jeong
Author_Institution :
R&D Center, Samsung Electro-Mech. Co., Suwon, South Korea
fDate :
9/1/2000 12:00:00 AM
Abstract :
The exchange coupling and the microstructures of the Ta/(Ni-Fe,Co-Fe)/Mn-Ir-Pt/Ta multilayers have been investigated by varying the compositions of Mn-Ir-Pt film. For exchange-bias layer (EBL) comprising NiFe/CoFe/Mn79.7Ir18.4Pt1.9 structures, the exchange bias field (Hex) of 441 Oe (exchange energy Jex of 0.236 erg/cm2) and the blocking temperature (T b) of 260°C was obtained. In addition, it is found that the Mn-Ir-Pt EBL´s have the polycrystalline structure and (111) texture. The crystallographic structure of the Mn-Ir-Pt film was face centered cubic (FCC)
Keywords :
antiferromagnetic materials; exchange interactions (electron); iridium alloys; magnetic anisotropy; magnetic multilayers; magnetic thin films; manganese alloys; platinum alloys; thermal stability; Mn-Ir-Pt; Mn-Ir-Pt exchange biased layer; Ta/NiFe/CoFe/Mn79.7Ir18.4Pt1.9 /Ta multilayer; blocking temperature; crystallographic structure; exchange anisotropy; exchange energy; microstructure; polycrystalline antiferromagnetic film; texture; thermal stability; Anisotropic magnetoresistance; Antiferromagnetic materials; Corrosion; Magnetic materials; Magnetic properties; Magnetic sensors; Microstructure; Sensor phenomena and characterization; Temperature sensors; Thermal stability;
Journal_Title :
Magnetics, IEEE Transactions on
