Performance and limitations of decomposition-based parameter extraction procedures for FET small-signal models

Author

Van Niekerk, Cornell ; Meyer, Petrie

Author_Institution

Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa

Volume

46

Issue

11

fYear

1998

fDate

11/1/1998 12:00:00 AM

Firstpage

1620

Lastpage

1627

Abstract

A recently proposed optimizer-based parameter-extraction technique using adaptive decomposition is subjected to a systematic and rigorous evaluation. The technique is shown to be robust and accurate under varying starting conditions. A study of convergence performance based on decomposition theory and test results is presented. Robustness tests are used to show that commonly used statistical descriptions such as mean and standard deviation are inadequate for presenting these types of test data

Keywords

Schottky gate field effect transistors; convergence; equivalent circuits; microwave field effect transistors; millimetre wave field effect transistors; optimisation; semiconductor device models; FET small-signal models; MESFET; adaptive decomposition; convergence performance; decomposition theory; decomposition-based parameter extraction; robustness tests; test data; Convergence; Design automation; FETs; Helium; MESFETs; Millimeter wave technology; Optimization methods; Parameter extraction; Robustness; Testing;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.734540

Filename

734540