DocumentCode :
1448130
Title :
Performance and limitations of decomposition-based parameter extraction procedures for FET small-signal models
Author :
Van Niekerk, Cornell ; Meyer, Petrie
Author_Institution :
Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa
Volume :
46
Issue :
11
fYear :
1998
fDate :
11/1/1998 12:00:00 AM
Firstpage :
1620
Lastpage :
1627
Abstract :
A recently proposed optimizer-based parameter-extraction technique using adaptive decomposition is subjected to a systematic and rigorous evaluation. The technique is shown to be robust and accurate under varying starting conditions. A study of convergence performance based on decomposition theory and test results is presented. Robustness tests are used to show that commonly used statistical descriptions such as mean and standard deviation are inadequate for presenting these types of test data
Keywords :
Schottky gate field effect transistors; convergence; equivalent circuits; microwave field effect transistors; millimetre wave field effect transistors; optimisation; semiconductor device models; FET small-signal models; MESFET; adaptive decomposition; convergence performance; decomposition theory; decomposition-based parameter extraction; robustness tests; test data; Convergence; Design automation; FETs; Helium; MESFETs; Millimeter wave technology; Optimization methods; Parameter extraction; Robustness; Testing;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.734540
Filename :
734540
Link To Document :
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