Theory and experiment of thin-film junction circulator

Author

How, H. ; Oliver, S.A. ; Mcknight, Stephen W. ; Zavracky, P.M. ; McGruer, N.E. ; Vittoria, C. ; Schmidt, R.

Author_Institution

Electromagn. Appl. Inc., Boston, MA, USA

Volume

46

Issue

11

fYear

1998

fDate

11/1/1998 12:00:00 AM

Firstpage

1645

Lastpage

1653

Abstract

We have calculated the S-parameters and losses in ferrite-film-junction circulators using a new effective-field theory assuming TEM-like propagation. Conductivity loss dominates the dielectric and magnetic losses in Y-junction circulators fabricated on ferrite films with thicknesses less than 200 μm. It is plausible to fabricate Y-junction thin-film circulator at X-band with insertion loss less than 0.5 dB if the film thickness is larger than 100 μm. The quality of the conductor plane is important in reducing the overall insertion loss of the thin-film-junction circulator

Keywords

S-parameters; ferrite circulators; losses; microwave circulators; 0.5 dB; 100 to 200 micron; S-parameters; TEM-like propagation; X-band; Y-junction circulators; conductivity loss; conductor plane quality; effective-field theory; ferrite film; insertion loss; losses; thin-film junction circulator; Conductivity; Dielectric losses; Dielectric thin films; Ferrite films; Insertion loss; Magnetic films; Magnetic losses; Propagation losses; Scattering parameters; Transistors;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.734547

Filename

734547