Title :
Contact-dependent reliability of spin valve heads
Author :
Tsu, I-Fei ; Morrone, Augusto ; Huang, Rong-Tan ; Chen, Fu-Rong
Author_Institution :
Seagate Technol., Minneapolis, MN, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
Contact-dependent failure modes were observed in spin valve sensors in nominal current density range of 2-5×107 A/cm2 at 70°C ambient. At high bias condition, continually decreased quasistatic test (QST) transfer curve amplitude with negligible resistance change was observed in sensors abutted with Ta contact. In contrast, steady resistance rise with relatively unchanged amplitude was seen in Ta/Au/Ta-contact device prior to catastrophic burnout. Void formation is apparent in the Au layer of the burnout device. Locations of the voids show bias polarity dependency, suggesting an electromigration mechanism in the Au layer
Keywords :
current density; electromigration; failure analysis; magnetic heads; reliability; spin valves; 70 degC; Ta-Au-Ta; bias condition; bias polarity dependency; burnout device; catastrophic burnout; contact-dependent reliability; current density; electromigration mechanism; failure modes; quasistatic test; resistance change; spin valve heads; spin valve sensors; transfer curve amplitude; Gold; Magnetic field measurement; Magnetic heads; Magnetic sensors; Ovens; Scanning electron microscopy; Spin valves; Temperature sensors; Thermal conductivity; Thermal sensors;
Journal_Title :
Magnetics, IEEE Transactions on
