Title :
Effect of film microstructure on exchange bias of IrMn/CoFe films
Author :
Pakala, Mahendra ; Huai, Yiming ; Anderson, Geoff
Author_Institution :
Read-Rite Corp., Fremont, CA, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
In order to isolate the effects of IrMn film grain size, texture and roughness on the temperature dependence of exchange bias field (H ex) different multilayers of the configuration UL/CoFe4/IrMn5/Ta3 nm (top) and UL/IrMn5/CoFe-4/Ta3 nm (bottom) were deposited. Underlayers (UL) used were Cu, Ru and [Cu1/Ru1 nm]n with thickness varying between 5-100 nm. The Hex vs. temperature curve shows a change in shape from a convex type to concave type with increasing the grain size. A qualitative explanation is given based on a thermal fluctuation aftereffect model
Keywords :
cobalt alloys; exchange interactions (electron); giant magnetoresistance; grain size; interface roughness; iridium alloys; iron alloys; magnetic multilayers; manganese alloys; spin valves; sputtered coatings; texture; thermal stability; 5 to 100 nm; IrMn-CoFe; activation energy; concave type curve; convex type curve; exchange bias; film microstructure effect; grain size; multilayers; roughness; spin valves; temperature dependence; texture; thermal fluctuation aftereffect model; thermal stability; Atomic force microscopy; Grain size; Magnetic field measurement; Magnetic films; Magnetosphere; Microstructure; Nonhomogeneous media; Temperature dependence; Thermal resistance; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
