An alternative method for end-effect characterization in shorted slotlines

Author

Duchamp, G. ; Casadebaig, L. ; Gauffre, S. ; Pistre, J.

Author_Institution

Lab. IXL, Bordeaux I Univ., Talence, France

Volume

46

Issue

11

fYear

1998

fDate

11/1/1998 12:00:00 AM

Firstpage

1793

Lastpage

1795

Abstract

In this paper, we propose an alternative method to characterize the end effects in shorted slotlines. Using a commercial software to model the transition, a simple mathematical expression of the end impedance, valid for a given substrate family and in a wide frequency domain, was achieved. Several dielectric substrates were considered and the obtained results were compared with experimental ones. A correct agreement was observed. This approach can also be useful in more complex simulations relative to multilayer structures

Keywords

equivalent circuits; impedance matrix; microstrip transitions; slot lines; waveguide theory; MDS momentum simulation; dielectric substrates; end impedance; end-effect characterization; equivalent circuit; line transitions; multilayer structures; shorted slot lines; slot-microstrip transition; wide frequency domain; Circuits; Dielectric substrates; Finite difference methods; Frequency; Impedance; Microstrip; Nonhomogeneous media; Slotline; Time domain analysis; Transmission line matrix methods;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.734583

Filename

734583