• DocumentCode
    1448408
  • Title

    Hidden Relationships: Bayesian Estimation With Partial Knowledge

  • Author

    Michaeli, Tomer ; Eldar, Yonina C.

  • Author_Institution
    Dept. of Electr. Eng., Technion - Israel Inst. of Technol., Haifa, Israel
  • Volume
    59
  • Issue
    5
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    1933
  • Lastpage
    1948
  • Abstract
    We address the problem of Bayesian estimation where the statistical relation between the signal and measurements is only partially known. We propose modeling partial Bayesian knowledge by using an auxiliary random vector called instrument. The statistical relations between the instrument and the signal and between the instrument and the measurements, are known. However, the joint probability function of the signal and measurements is unknown. Two types of statistical relations are considered, corresponding to second-order moment and complete distribution function knowledge. We propose two approaches for estimation in partial knowledge scenarios. The first is based on replacing the orthogonality principle by an oblique counterpart and is proven to coincide with the method of instrumental variables from statistics, although developed in a different context. The second is based on a worst-case design strategy and is shown to be advantageous in many aspects. We provide a thorough analysis showing in which situations each of the methods is preferable and propose a nonparametric method for approximating the estimators from a set of examples. Finally, we demonstrate our approach in the context of enhancement of facial images that have undergone unknown degradation and image zooming.
  • Keywords
    Bayes methods; image enhancement; probability; vectors; Bayesian estimation; auxiliary random vector; facial image enhancement; image zooming; instrument; joint probability function; partial Bayesian knowledge modeling; partial knowledge estimation; second-order moment; statistical relation; worst-case design strategy; Bayesian methods; Cameras; Density functional theory; Instruments; Joints; Noise measurement; Training; Bayesian estimation; instrumental variables; minimax regret; nonparametric regression; partial knowledge;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2011.2113343
  • Filename
    5711686