Title :
Calibration of fly height measured by scattered total internal reflection
Author :
Strunk, Corley W. ; Lo, Jenny L. ; Sides, Paul J.
Author_Institution :
Data Storage Syst. Centre, Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
Fly height was measured using Scattered Total Internal Reflection (SCATIR). A calibration method for this technique was developed, and the results were compared to those from a Phase Metrics Dynamic Fly Height Tester (DFHT) II. Measurements from the two methods on the same slider agreed well in the region from 20-80 nm. SCATIR is at least comparable to three-wavelength interferometry, and potentially superior in that (i) signal intensity increases as the fly height decreases, (ii) calibration and measurement occur in one location, and (iii) the sensitivity can be optimized for a desired range of fly height
Keywords :
calibration; height measurement; light reflection; light scattering; magnetic heads; DFHT II; calibration; evanescent radiation; fly height measurement; head-disk interface; magnetic recording; phase metrics dynamic fly height tester; scattered total internal reflection; slider; Calibration; Light scattering; Magnetic heads; Optical interferometry; Optical polarization; Optical reflection; Optical refraction; Optical scattering; Optical surface waves; Optical variables control;
Journal_Title :
Magnetics, IEEE Transactions on