DocumentCode :
1448620
Title :
A Fully Integrated Architecture for Fast and Accurate Programming of Floating Gates Over Six Decades of Current
Author :
Basu, Arindam ; Hasler, Paul E.
Author_Institution :
Dept. of Electr. & Comput. Engi neering, Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
19
Issue :
6
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
953
Lastpage :
962
Abstract :
This paper presents an on-chip system with digital serial peripheral interface (SPI) interface that enables accurate programming of floating gate arrays at a high speed. The main component allowing this speedup is a floating point current measuring analog-to-digital convertor (ADC). The ADC comprises a wide range logarithmic transimpedance amplifier (TIA) followed by a linear ramp ADC. The TIA operates over seven decades of current going down to sub-pA levels. It incorporates an adaptive biasing scheme to save power. The topology provides a relatively temperature independent measurement of the floating-gate voltage. The TIA-ADC combination operates over six decades at a thermal noise limited accuracy of 9.5 bits when average conversion time is around 500 μs. The system features level-shifters and selection circuitry at the periphery of the floating gate array, current-steering digital-to-analog converters (DACs) to set gate and drain voltages, and SPI for a microprocessor or field-programmable gate array (FPGA). Algorithms using either pulse-width modulation or drain voltage modulation can be implemented on this platform. We present data for this system from 0.5 μm AMI and 0.35 μ m TSMC processes.
Keywords :
analogue-digital conversion; digital-analogue conversion; field programmable gate arrays; logic arrays; logic gates; operational amplifiers; pulse width modulation; adaptive biasing scheme; current-steering digital-to-analog converter; digital serial peripheral interface interface; drain voltage modulation; field-programmable gate array; floating gate array programming; fully integrated architecture; level-shifter; linear ramp analog-to-digital convertor; logarithmic transimpedance amplifier; microprocessor; on-chip system; pulse-width modulation; selection circuitry; size 0.35 mum; size 0.5 mum; Analog-digital conversion; Circuit noise; Current measurement; Field programmable gate arrays; Pulse modulation; System-on-a-chip; Temperature measurement; Topology; Velocity measurement; Voltage; Floating-gate programming; floating-point analog-to-digital converter (ADC); hot-electron injection; logarithmic compression; low power; programmable analog;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2042626
Filename :
5437216
Link To Document :
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