DocumentCode :
1448698
Title :
Measurements of a fabricated micro mirror using a lateral-effect position-sensitive photodiode
Author :
Chung, Seok-Whan ; Kim, Yong-Kweon
Author_Institution :
Dept. of Electr. Eng., Seoul Nat. Univ., South Korea
Volume :
45
Issue :
6
fYear :
1998
fDate :
12/1/1998 12:00:00 AM
Firstpage :
861
Lastpage :
865
Abstract :
The characteristics of a fabricated micro mirror were determined using an optical measurement system. The system consisted of a helium-neon laser, a p-i-n lateral-effect photodiode, and other fundamental optical elements. For testing, we used a micro mirror array (1×4) in which each mirror was composed of a mirror plate, two torsional flexure hinges, two address electrodes, and two support posts. A mirror plate was designed to a size of 100×110×1.5 μm 3 and the hinge size was 20 μm long, 5 μm wide, and 0.5 μm thick. The micro mirror array was fabricated using micromachining technology and a lithography-galvanoformung-abformung-like process using nickel electroplating. The variation in the mirror´s deflection angle with applied voltage was measured as a static characteristic. The downward threshold voltage of the 0.5-μm thick hinge was 48 V. The step response time, as a dynamic characteristic, was 21.8 μs when a 64 V step voltage higher than the downward threshold voltage was applied to an address electrode. The lifetime of the fabricated micro mirror was tested for both unidirectional and bidirectional operation
Keywords :
LIGA; electro-optical deflectors; measurement by laser beam; micro-optics; micromachining; mirrors; optical arrays; optical fabrication; optical testing; optical variables measurement; p-i-n photodiodes; 0.5 mum; 1.5 mum; 100 mum; 110 mum; 12.8 mus; 20 mum; 48 V; 5 mum; 64 V; address electrodes; bidirectional operation; downward threshold voltage; dynamic characteristic; helium-neon laser; hinge size; lateral-effect position-sensitive photodiode; lithography-galvanoformung-abformung-like process; micro mirror; micro mirror array; micromachining technology; mirror deflection angle; mirror plate; nickel electroplating; p-i-n lateral-effect photodiode; step response time; support posts; torsional flexure hinges; unidirectional operation; Delay; Electrodes; Fasteners; Micromachining; Mirrors; Nickel; PIN photodiodes; Testing; Threshold voltage; Voltage measurement;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/41.735329
Filename :
735329
Link To Document :
بازگشت