DocumentCode
1448698
Title
Measurements of a fabricated micro mirror using a lateral-effect position-sensitive photodiode
Author
Chung, Seok-Whan ; Kim, Yong-Kweon
Author_Institution
Dept. of Electr. Eng., Seoul Nat. Univ., South Korea
Volume
45
Issue
6
fYear
1998
fDate
12/1/1998 12:00:00 AM
Firstpage
861
Lastpage
865
Abstract
The characteristics of a fabricated micro mirror were determined using an optical measurement system. The system consisted of a helium-neon laser, a p-i-n lateral-effect photodiode, and other fundamental optical elements. For testing, we used a micro mirror array (1×4) in which each mirror was composed of a mirror plate, two torsional flexure hinges, two address electrodes, and two support posts. A mirror plate was designed to a size of 100×110×1.5 μm 3 and the hinge size was 20 μm long, 5 μm wide, and 0.5 μm thick. The micro mirror array was fabricated using micromachining technology and a lithography-galvanoformung-abformung-like process using nickel electroplating. The variation in the mirror´s deflection angle with applied voltage was measured as a static characteristic. The downward threshold voltage of the 0.5-μm thick hinge was 48 V. The step response time, as a dynamic characteristic, was 21.8 μs when a 64 V step voltage higher than the downward threshold voltage was applied to an address electrode. The lifetime of the fabricated micro mirror was tested for both unidirectional and bidirectional operation
Keywords
LIGA; electro-optical deflectors; measurement by laser beam; micro-optics; micromachining; mirrors; optical arrays; optical fabrication; optical testing; optical variables measurement; p-i-n photodiodes; 0.5 mum; 1.5 mum; 100 mum; 110 mum; 12.8 mus; 20 mum; 48 V; 5 mum; 64 V; address electrodes; bidirectional operation; downward threshold voltage; dynamic characteristic; helium-neon laser; hinge size; lateral-effect position-sensitive photodiode; lithography-galvanoformung-abformung-like process; micro mirror; micro mirror array; micromachining technology; mirror deflection angle; mirror plate; nickel electroplating; p-i-n lateral-effect photodiode; step response time; support posts; torsional flexure hinges; unidirectional operation; Delay; Electrodes; Fasteners; Micromachining; Mirrors; Nickel; PIN photodiodes; Testing; Threshold voltage; Voltage measurement;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/41.735329
Filename
735329
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