DocumentCode :
144870
Title :
Investigation into the impact of grain-size and grain-size variation on system level error rates
Author :
Chan Kheong Sann ; Yu, Maria Lin ; Teo Kim Keng ; Piramanayagam, S.N.
Author_Institution :
Data Storage Inst., Agency for Sci., Technol. & Res., Singapore, Singapore
fYear :
2014
fDate :
22-23 Sept. 2014
Firstpage :
1
Lastpage :
2
Abstract :
Grain size and grain-size distributions are two parameters that play critical roles in the performance of magnetic recording media, in determining the densities that they support. Smaller magnetically isolated grains lead to less jitter noise, thereby leading to lower BER´s and higher areal densities. Similarly, a smaller grain-size distribution indicates fewer larger and smaller grains again leading to less jitter noise and higher areal densities. In this paper, we study the impact of these two geometrical parameters on the system-level performance, holding all other magnetic parameters constant.
Keywords :
error statistics; grain size; jitter; magnetic recording; noise; BER; areal densities; grain-size distributions; grain-size variation; jitter noise; magnetic parameters constant; magnetic recording media; system level error rates; Bit error rate; Grain size; Jitter; Magnetic recording; Media; Micromagnetics; GFP model; bER; grain size; grain size distribution; magnetic recording media; micromagnetic simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Symposium 2014 - Celebrating 50th Anniversary of IEEE Magnetics Society (MSSC50)
Conference_Location :
Singapore
Type :
conf
DOI :
10.1109/MSSC.2014.6947942
Filename :
6947942
Link To Document :
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