DocumentCode :
1448883
Title :
Nested Digital Background Calibration of a 12-bit Pipelined ADC Without an Input SHA
Author :
Wang, Haoyue ; Wang, Xiaoyue ; Hurst, Paul J. ; Lewis, Stephen H.
Author_Institution :
Univ. of California, Davis, CA, USA
Volume :
44
Issue :
10
fYear :
2009
Firstpage :
2780
Lastpage :
2789
Abstract :
To reduce power dissipation, the input sample-and-hold amplifier (SHA) is eliminated in a pipelined analog-to-digital converter (ADC) with nested background calibration. The nested architecture calibrates the pipelined ADC with an algorithmic ADC that is also calibrated. Without an input SHA, a timing difference between the sampling instants of the two ADCs creates an error that interferes with calibration of the pipelined ADC. This problem is overcome with digital background timing compensation. It uses a differentiator with fixed coefficients to build an adaptive interpolator. With a 58-kHz sinusoidal input, the 12-bit 20-Msample/s pipelined ADC achieves a signal-to-noise-and-distortion ratio (SNDR) of 70.2 dB, a spurious-free dynamic range (SFDR) of 80.3 dB, and an integral nonlinearity (INL) of 0.75 least significant bit (LSB). With a 9-MHz input, the SNDR is 64.2 dB, and the SFDR is 78.3 dB. About 2 million samples or 0.1 s are required for convergence. The prototype occupies 7.5 mm2 in 0.35-mum CMOS and dissipates 231 mW from 3.3 V, which is 23 mW less than in a previous prototype with the input SHA.
Keywords :
amplifiers; analogue-digital conversion; calibration; CMOS; digital background timing compensation; fixed coefficients; frequency 58 kHz; frequency 9 MHz; integral nonlinearity; least significant bit; nested digital background calibration; pipelined analog-to-digital converter; power 231 mW; sample-and-hold amplifier; signal-to-noise-and-distortion ratio; size 0.35 mum; spurious-free dynamic range; time 0.1 s; voltage 3.3 V; Calibration; Error correction; Linearity; Operational amplifiers; Power amplifiers; Power dissipation; Prototypes; Sampling methods; Semiconductor device noise; Timing; Analog-to-digital conversion; CMOS analog integrated circuits; digital background calibration; nested calibration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2009.2028756
Filename :
5256967
Link To Document :
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