DocumentCode
1448902
Title
The magnetic properties of cobalt films produced by glancing angle deposition
Author
Liu, F. ; Yu, C. ; Shen, L. ; Barnard, J. ; Mankey, G.J.
Author_Institution
Center for Mater. for Inf. Technol., Alabama Univ., Tuscaloosa, AL, USA
Volume
36
Issue
5
fYear
2000
fDate
9/1/2000 12:00:00 AM
Firstpage
2939
Lastpage
2941
Abstract
The magnetic properties of columnar cobalt films fabricated by glancing angle deposition were investigated. Varying the azimuthal rotation speed and polar angle of incidence of the vapor flux produces films with different microstructures. The magnetic anisotropies and squareness ratio between perpendicular and in-plane hysteresis loops are measured for various films and found to have a weak dependence on the azimuthal rotation speed of the substrate at the polar angle of 75°. The squareness ratio is strongly affected by the variation of the polar angle of incidence of the vapor flux. At an azimuthal rotation speed of 0.092 rev/s and polar angle of 83°, the Co film is composed of well-separated columns with the packing fraction of 0.3. The hysteresis loops of this film exhibit a perpendicular anisotropy with the squareness ratio of 1.6. The X-ray diffraction spectrum shows that the Co columns possess a strong (21¯1¯2) preferred orientation, which indicates that the perpendicular anisotropy is from shape anisotropy and not from crystalline anisotropy
Keywords
X-ray diffraction; cobalt; crystal microstructure; electron beam deposition; ferromagnetic materials; magnetic hysteresis; magnetic thin films; perpendicular magnetic anisotropy; texture; Co; X-ray diffraction; azimuthal rotation speed; cobalt films; columnar cobalt films; glancing angle deposition; hysteresis loops; in-plane hysteresis loops; magnetic anisotropies; magnetic properties; microstructure; packing fraction; perpendicular anisotropy; perpendicular hysteresis loops; polar angle; preferred orientation; shape anisotropy; squareness ratio; Anisotropic magnetoresistance; Cobalt; Magnetic anisotropy; Magnetic films; Magnetic hysteresis; Magnetic properties; Microstructure; Rotation measurement; Substrates; Velocity measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.908634
Filename
908634
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